• DocumentCode
    3106445
  • Title

    On-Line Parameter Estimation in General State-Space Models

  • Author

    Andrieu, Christophe ; Doucet, Arnaud ; Tadic, Vladislav B.

  • Author_Institution
    School of Mathematics, University of Bristol, UK. c.andrieu@bris.ac.uk
  • fYear
    2005
  • fDate
    12-15 Dec. 2005
  • Firstpage
    332
  • Lastpage
    337
  • Abstract
    The estimation of static parameters in general non-linear non-Gaussian state-space models is a long-standing problem. This is despite the advent of Sequential Monte Carlo (SMC, aka particle filters) methods, which provide very good approximations to the optimal filter under weak assumptions. Several algorithms based on SMC have been proposed in the past 10 years to solve the static parameter problem. However all the algorithms we are aware of suffer from the so-called `degeneracy problem´. We propose here a methodology for point estimation of static parameters which does not suffer from this problem. Our methods take advantage of the fact that many state space models of interest are ergodic and stationary: this allows us to propose contrast functions for the static parameter which can be consistently estimated and optimised using simulation-based methods. Several types of contrast functions are possible but we focus here on the average of a so-called pseudo-likelihood which we maximize using on-line Expectation-Maximization type algorithms. In its basic form the algorithm requires the expression of the invariant distribution of the underlying state process. When the invariant distribution is unknown, we present an alternative which relies on indirect inference techniques.
  • Keywords
    Automatic control; Inference algorithms; Mathematical model; Mathematics; Monte Carlo methods; Parameter estimation; Probability distribution; Sliding mode control; State estimation; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 2005 and 2005 European Control Conference. CDC-ECC '05. 44th IEEE Conference on
  • Print_ISBN
    0-7803-9567-0
  • Type

    conf

  • DOI
    10.1109/CDC.2005.1582177
  • Filename
    1582177