A novel method based on wavelet threshold de-noising technology and Prony analysis for flicker measurement

Author

Zhang, Youbing ; Chen, Quan ; Liu, Jianxiong ; Hu, Yi ; Cao, Yijia

Author_Institution

Zhejiang Univ. of Technol.

fYear

2008

fDate

1-4 Sept. 2008

Firstpage

1

Lastpage

4

Abstract

Voltage fluctuation and voltage flicker as indexes of power quality (PQ) have been attracting more and more attentions. In this paper, a novel method based on the wavelet threshold de-noising technology and the Prony analysis for flicker measurement is introduced. Firstly, an improved wavelet threshold de-noising technology is used to pretreat the data of voltage flicker signal. Then the Prony algorithm is adopted to extract the amplitudes, frequencies, and phase angles of all frequency components of the voltage flicker signal. Finally, reconstructing voltage flicker signal and constructing its orthogonal signal as linear combination of sinusoids, the envelope of the voltage flicker signal is obtained by the principle of envelop detection.

Keywords

feature extraction; power supply quality; signal denoising; signal reconstruction; wavelet transforms; Prony analysis; amplitude extraction; envelop detection; flicker measurement; frequency components; linear combination; orthogonal signal construction; phase angles; power quality; voltage flicker signal; voltage flicker signal reconstruction; voltage fluctuation; wavelet threshold de-noising technology; 1f noise; Algorithm design and analysis; Frequency estimation; Noise reduction; Power measurement; Power quality; Threshold voltage; Voltage fluctuations; Wavelet analysis; Wavelet transforms;

fLanguage

English

Publisher

ieee

Conference_Titel

Universities Power Engineering Conference, 2008. UPEC 2008. 43rd International

Conference_Location

Padova

Print_ISBN

978-1-4244-3294-3

Electronic_ISBN

978-88-89884-09-6

Type

conf

DOI

10.1109/UPEC.2008.4651602

Filename

4651602