Title :
A novel method based on wavelet threshold de-noising technology and Prony analysis for flicker measurement
Author :
Zhang, Youbing ; Chen, Quan ; Liu, Jianxiong ; Hu, Yi ; Cao, Yijia
Author_Institution :
Zhejiang Univ. of Technol.
Abstract :
Voltage fluctuation and voltage flicker as indexes of power quality (PQ) have been attracting more and more attentions. In this paper, a novel method based on the wavelet threshold de-noising technology and the Prony analysis for flicker measurement is introduced. Firstly, an improved wavelet threshold de-noising technology is used to pretreat the data of voltage flicker signal. Then the Prony algorithm is adopted to extract the amplitudes, frequencies, and phase angles of all frequency components of the voltage flicker signal. Finally, reconstructing voltage flicker signal and constructing its orthogonal signal as linear combination of sinusoids, the envelope of the voltage flicker signal is obtained by the principle of envelop detection.
Keywords :
feature extraction; power supply quality; signal denoising; signal reconstruction; wavelet transforms; Prony analysis; amplitude extraction; envelop detection; flicker measurement; frequency components; linear combination; orthogonal signal construction; phase angles; power quality; voltage flicker signal; voltage flicker signal reconstruction; voltage fluctuation; wavelet threshold de-noising technology; 1f noise; Algorithm design and analysis; Frequency estimation; Noise reduction; Power measurement; Power quality; Threshold voltage; Voltage fluctuations; Wavelet analysis; Wavelet transforms;
Conference_Titel :
Universities Power Engineering Conference, 2008. UPEC 2008. 43rd International
Conference_Location :
Padova
Print_ISBN :
978-1-4244-3294-3
Electronic_ISBN :
978-88-89884-09-6
DOI :
10.1109/UPEC.2008.4651602
