Title :
A method for measuring the cycle-to-cycle period jitter of high-frequency clock signals
Author :
Yamaguchi, Takahiro J. ; Soma, Mani ; Halter, David ; Raina, Rajesh ; Nissen, Jim ; Ishida, Masahiro
Author_Institution :
Advantest Labs. Ltd., Miyagi, Japan
Abstract :
This paper introduces the extended Δφ method for measuring cycle-to-cycle period jitter in PLL outputs. The theoretical basis for this method is derived from the limited condition for the average period and analytic signal theory. Sinusoidal jitter measurements verify the relationship between cycle-to-cycle period jitter and timing jitter. To validate the method, experimental data from jitter measurements on a PowerPCTM microprocessor is analyzed in the frequency domain. Comparisons of phase quantization errors are made between the extended Δφ method and the conventional zero-crossing method
Keywords :
clocks; digital phase locked loops; frequency-domain analysis; integrated circuit measurement; microprocessor chips; quantisation (signal); timing jitter; PLL outputs; PowerPC microprocessor; analytic signal theory; average period; cycle-to-cycle period jitter; extended Δφ method; frequency domain; high-frequency clock signals; jitter measurements; phase quantization errors; timing jitter; Clocks; Electric variables measurement; Frequency estimation; Frequency measurement; Microprocessors; Phase measurement; Phase noise; Quantization; Testing; Timing jitter;
Conference_Titel :
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location :
Marina Del Rey, CA
Print_ISBN :
0-7695-1122-8
DOI :
10.1109/VTS.2001.923425