Title :
Current measurement for dynamic Idd test
Author :
Sun, Xiaoyun ; Vinnakota, Bapiraju
Author_Institution :
Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
Abstract :
A recently developed dynamic Idd test parameter, the Energy Consumption Ratio (ECR), is based on the average current drawn by a circuit. Very fast measurement equipment is needed to measure the exact supply current transients in high-speed circuits. However, the ECR requires the average value of the transient supply current and not the exact transient. Common sampling and filtering techniques can be combined to greatly reduce measurement cost. Three approaches to combine filtering and different sampling techniques are studied in this paper. Theoretical analysis based on first order approximation and simulation results for these approaches are also presented
Keywords :
CMOS integrated circuits; electric current measurement; integrated circuit testing; signal sampling; transients; CMOS; average current; current measurement; dynamic Idd test; energy consumption ratio; exact supply current transients; first order approximation; measurement cost; sampling techniques; transient supply current; Circuit testing; Costs; Current measurement; Current supplies; Electric variables measurement; Filtering; Frequency synchronization; Sampling methods; Time measurement; Transducers;
Conference_Titel :
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location :
Marina Del Rey, CA
Print_ISBN :
0-7695-1122-8
DOI :
10.1109/VTS.2001.923427
