• DocumentCode
    3106581
  • Title

    Current measurement for dynamic Idd test

  • Author

    Sun, Xiaoyun ; Vinnakota, Bapiraju

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    117
  • Lastpage
    122
  • Abstract
    A recently developed dynamic Idd test parameter, the Energy Consumption Ratio (ECR), is based on the average current drawn by a circuit. Very fast measurement equipment is needed to measure the exact supply current transients in high-speed circuits. However, the ECR requires the average value of the transient supply current and not the exact transient. Common sampling and filtering techniques can be combined to greatly reduce measurement cost. Three approaches to combine filtering and different sampling techniques are studied in this paper. Theoretical analysis based on first order approximation and simulation results for these approaches are also presented
  • Keywords
    CMOS integrated circuits; electric current measurement; integrated circuit testing; signal sampling; transients; CMOS; average current; current measurement; dynamic Idd test; energy consumption ratio; exact supply current transients; first order approximation; measurement cost; sampling techniques; transient supply current; Circuit testing; Costs; Current measurement; Current supplies; Electric variables measurement; Filtering; Frequency synchronization; Sampling methods; Time measurement; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
  • Conference_Location
    Marina Del Rey, CA
  • Print_ISBN
    0-7695-1122-8
  • Type

    conf

  • DOI
    10.1109/VTS.2001.923427
  • Filename
    923427