• DocumentCode
    3106640
  • Title

    Faster than Nyquist, slower than Tropp

  • Author

    Harms, Andrew ; Bajway, Waheed U. ; Calderban, Robert

  • Author_Institution
    Dept. of Electr. Eng., Princeton Univ., Princeton, NJ, USA
  • fYear
    2011
  • fDate
    13-16 Dec. 2011
  • Firstpage
    345
  • Lastpage
    348
  • Abstract
    The sampling rate of analog-to-digital converters is severely limited by underlying technological constraints. Recently, Tropp et al. proposed a new architecture, called a random demodulator (RD), that attempts to circumvent this limitation by sampling sparse, bandlimited signals at a rate much lower than the Nyquist rate. An integral part of this architecture is a random bi-polar modulating waveform (MW) that changes polarity at the Nyquist rate of the input signal. Technological constraints also limit how fast such a waveform can change polarity, so we propose an extension of the RD that uses a run-length limited MW which changes polarity at a slower rate. We call this extension a constrained random demodulator (CRD) and establish that it enjoys theoretical guarantees similar to the RD and that these guarantees are directly related to the power spectrum of the MW. Further, we put forth the notion of knowledge-enhanced CRD in the paper. Specifically, we show through simulations that matching the distribution of spectral energy of the input signal with the power spectrum of the MW results in the CRD performing better than the RD of Tropp et al.
  • Keywords
    analogue-digital conversion; demodulators; modulation; signal sampling; Nyquist rate; analog-to-digital converter; bandlimited signal sampling; constrained random demodulator; random bipolar modulating waveform; run-length limited modulating waveform; sampling rate; sparse sampling; technological constraints; Bandwidth; Baseband; Correlation; Demodulation; Frequency modulation; Sensors; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Advances in Multi-Sensor Adaptive Processing (CAMSAP), 2011 4th IEEE International Workshop on
  • Conference_Location
    San Juan
  • Print_ISBN
    978-1-4577-2104-5
  • Type

    conf

  • DOI
    10.1109/CAMSAP.2011.6136022
  • Filename
    6136022