DocumentCode :
3106732
Title :
Design diversity for concurrent error detection in sequential logic circuits
Author :
Mitra, Subhasish ; McCluskey, Edward J.
Author_Institution :
Center for Reliable Comput., Stanford Univ., CA, USA
fYear :
2001
fDate :
2001
Firstpage :
178
Lastpage :
183
Abstract :
We present a technique using diverse duplication to implement concurrent error detection (CED) in sequential logic circuits. We examine three different approaches for this purpose: (1) identical state encoding of the two sequential logic implementations, duplication of flip-flops, diverse implementation of the combinational logic part (output logic and next-state logic) and comparators on flip-flop outputs and primary outputs; (2) diverse state encoding of the two implementations, duplication of flip-flops, diverse combinational logic implementation and comparators on primary outputs only; and (3) identical state encoding, parity prediction for the flip-flops, diverse combinational logic implementation, comparators on primary outputs and parity checkers on flip-flop outputs. Our results for the simulated sequential benchmark circuits demonstrate that the third approach is most efficient in protecting sequential logic circuits against multiple and common-mode failures. The computational complexity of the data integrity analysis of the third approach is of the same order as that of the first approach and is at least an order of magnitude less than that of the second approach
Keywords :
VLSI; computational complexity; data integrity; error detection; flip-flops; integrated circuit testing; integrated logic circuits; logic design; logic testing; sequential circuits; common-mode failures; comparators; computational complexity; concurrent error detection; data integrity analysis; design diversity; diverse combinational logic implementation; diverse duplication; flip-flops; multiple failures; parity checkers; parity prediction; sequential logic circuits; state encoding; Circuit faults; Circuit simulation; Computational modeling; Computer errors; Concurrent computing; Data analysis; Encoding; Flip-flops; Reconfigurable logic; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location :
Marina Del Rey, CA
Print_ISBN :
0-7695-1122-8
Type :
conf
DOI :
10.1109/VTS.2001.923436
Filename :
923436
Link To Document :
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