DocumentCode :
3106757
Title :
Early error detection in systems-on-chip for fault-tolerance and at-speed debugging
Author :
Sogomonyan, E.S. ; Morosov, A. ; Gössel, M. ; Singh, A. ; Rzeha, J.
fYear :
2001
fDate :
2001
Firstpage :
184
Lastpage :
189
Abstract :
In this paper we propose a new method for the design of duplex fault-tolerant systems with early error detection and high availability. All the scannable memory elements (flip-flops) of the duplicated system are implemented as multimode memory elements according to Singh et al. (1999), thus allowing during normal operation the accumulation of a signature of its states in its scan-paths. By continuously comparing a 1-bit sequence of the compacted scan-out outputs of the accumulated signatures of the duplicated systems an error can be already detected and a recovery procedure started before an erroneous result appears at the system outputs when a computations is completed. The accumulation of a signature during normal operation can also be used for debugging at-speed. For this application the system need not be duplicated
Keywords :
VLSI; computer debugging; error detection; fault tolerant computing; integrated circuit testing; logic testing; microprocessor chips; mixed analogue-digital integrated circuits; SoC testing; accumulated signatures; at-speed debugging; compacted scan-out outputs; duplex fault-tolerant systems; early error detection; fault-tolerance; flip-flops; high availability; multimode memory elements; recovery procedure initiation; scan-paths; scannable memory elements; systems-on-chip; Circuit faults; Circuit testing; Computer errors; Debugging; Fault detection; Fault tolerant systems; Hardware; Integrated circuit testing; Redundancy; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location :
Marina Del Rey, CA
Print_ISBN :
0-7695-1122-8
Type :
conf
DOI :
10.1109/VTS.2001.923437
Filename :
923437
Link To Document :
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