DocumentCode
3106831
Title
Embedded-software-based approach to testing crosstalk-induced faults at on-chip buses
Author
Lai, Wei-Cheng ; Huang, Jing-Reng ; Cheng, Kwang-Ting
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fYear
2001
fDate
2001
Firstpage
204
Lastpage
209
Abstract
Crosstalk effects on long interconnects are becoming significant for high-speed circuits. This paper addresses the problem of testing crosstalk-induced faults at on-chip buses in system-on-a-chip (SOC) designs. We propose a method to self-test on-chip buses at-speed, by executing an automatically synthesized program using on-chip processor cores. The test program, executed at system operational speed, can activate and capture the worst-case crosstalk effects on buses and achieve a complete coverage of crosstalk-induced logical and delay faults. This paper discusses the method and the framework for synthesizing such a test program. Based on the bus protocol, the instruction set architecture of an on-chip processor core, and the system specification, the method generates deterministic tests in the form of instruction sequences. The synthesized test program is highly modularized and compact. The experimental results show that, for testing interconnects between a processor core and any other on-chip core, a 3 K-byte program is sufficient to achieve the complete coverage for crosstalk-induced logical and delay faults
Keywords
application specific integrated circuits; crosstalk; delays; fault diagnosis; high-speed integrated circuits; instruction sets; integrated circuit interconnections; logic testing; production testing; automatically synthesized program; crosstalk-induced delay faults; crosstalk-induced faults; crosstalk-induced logical faults; deterministic tests; embedded-software-based approach; high-speed circuits; instruction sequences; instruction set architecture; interconnects; on-chip buses; on-chip processor cores; processor core; system operational speed; system specification; system-on-a-chip designs; worst-case crosstalk effects; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Crosstalk; Delay effects; Integrated circuit interconnections; Logic testing; System testing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location
Marina Del Rey, CA
Print_ISBN
0-7695-1122-8
Type
conf
DOI
10.1109/VTS.2001.923440
Filename
923440
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