Title :
Crosstalk effect in coupled interconnect lines using FDTD method
Author :
Mittal, Sparsh ; Kaushik, B.K. ; Yadav, K.L. ; Sharma, D.K. ; Majumder, Manoj Kumar
Author_Institution :
Indian Inst. of Technol. Roorkee, Roorkee, India
Abstract :
Technological advancement below 65nm has resulted in high speed complex VLSI interconnects. As an essential design criterion, these high frequency interconnects require accurate analysis in time/frequency domain and crosstalk estimation. This research work employs the finite difference time domain (FDTD) method for estimation of voltages and currents on coupled transmission line. Moreover, crosstalk delay in RLC interconnects is analyzed using FDTD method. Both functional and dynamic crosstalk effects in coupled line configuration are analyzed. Effect of line resistance on delay is also evaluated. A linear resistive driver is used to drive distributed RLC transmission line. Encouragingly, analytical results for proposed FDTD model are in good agreement with HSPICE circuit simulation results.
Keywords :
RLC circuits; coupled transmission lines; crosstalk; finite difference time-domain analysis; telecommunication transmission lines; time-frequency analysis; FDTD Method; FDTD method; HSPICE circuit simulation; coupled interconnect transmission lines; crosstalk delay; crosstalk estimation; current estimation; distributed RLC transmission line; finite difference time domain; high speed complex VLSI interconnects; linear resistive driver; time-frequency domain; voltage estimation; Decision support systems; Finite difference methods; Intelligent systems; Mercury (metals); Time domain analysis; VLSI; crosstalk delay; finite difference time domain (FDTD); interconnects; time domain; transmission line;
Conference_Titel :
Communications, Devices and Intelligent Systems (CODIS), 2012 International Conference on
Conference_Location :
Kolkata
Print_ISBN :
978-1-4673-4699-3
DOI :
10.1109/CODIS.2012.6422214
