Title :
Experiments with autonomous test of PLAs
Author :
Aas, Einar J. ; Nystu, Gunnar
Author_Institution :
Norwegian Inst. of Technol., Trondheim Univ., Norway
Abstract :
An architecture for BIST of PLAs is presented, together with a testability analysis tool to assert test quality. The functionality of the PLA itself is utilized for stimuli generation. Experiments assert that the test patterns generated can be considered as random patterns with equal 1 and 0 probability of each input. Test quality is measured based upon computed fault detectability and estimated fault coverage at a desired confidence level. A set of 53 PLA benchmark circuits from Berkeley is used to demonstrate the features of the method. It is found that 37 of 53 PLAs are random testable to 99% fault coverage with less than 100000 patterns
Keywords :
automatic testing; built-in self test; fault location; integrated circuit testing; logic arrays; logic testing; BIST; PLA; autonomous test; benchmark circuits; fault coverage; fault detectability; programmable logic arrays; random patterns; stimuli generation; testability analysis tool; Analytical models; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Computational modeling; Electrical fault detection; Programmable logic arrays; Telecommunication control; Test pattern generators;
Conference_Titel :
Design Automation. EDAC., Proceedings of the European Conference on
Conference_Location :
Amsterdam
DOI :
10.1109/EDAC.1991.206458
