Title :
SPIRIT: a highly robust combinational test generation algorithm
Author :
Gizdarski, Emil ; Fujiwara, Hideo
Author_Institution :
Dept. of Comput. Syst., Rousse Univ., Bulgaria
Abstract :
In this paper we present a robust test generation algorithm for combinational circuits based on the Boolean satisfiability method called SPIRIT. We elaborate some well-known techniques as well as presenting new techniques that improve the performance and robustness of test generation algorithms. As a result, SPIRIT achieves 100% fault efficiency for a full scan version of the ITC´99 benchmark circuits in a reasonable amount of time
Keywords :
Boolean functions; automatic testing; combinational circuits; fault diagnosis; integrated circuit testing; logic testing; Boolean satisfiability method; ITC´99 benchmark circuits; SPIRIT; combinational circuits; combinational test generation algorithm; fault efficiency; full scan version; robustness; Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Electronic design automation and methodology; Electronic mail; Logic testing; Robustness; System testing;
Conference_Titel :
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location :
Marina Del Rey, CA
Print_ISBN :
0-7695-1122-8
DOI :
10.1109/VTS.2001.923461
