DocumentCode :
3107202
Title :
Precedence-based, preemptive, and power-constrained test scheduling for system-on-a-chip
Author :
Iyengar, Vikram ; Chakrabarty, Krishnendu
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
fYear :
2001
fDate :
2001
Firstpage :
368
Lastpage :
374
Abstract :
Test scheduling is a major problem in system-on-a-chip (SOC) test automation. We present an integrated framework that addresses several important test scheduling problems. We first present efficient techniques to determine optimal SOC test schedules with precedence constraints, i.e., schedules that preserve desirable orderings among tests. We then present a new algorithm that uses preemption to obtain optimal test schedules in polynomial time. Finally, we present a new method for determining optimal power-constrained schedules. Experimental results for a representative SOC show that test schedules can be obtained in reasonable CPU time for all cases
Keywords :
application specific integrated circuits; automatic testing; integrated circuit testing; low-power electronics; scheduling; CPU time; polynomial time; power-constrained test scheduling; precedence constraints; system-on-a-chip; test automation; test scheduling problems; Automatic testing; Built-in self-test; Engines; Job shop scheduling; Power dissipation; Power engineering computing; Processor scheduling; Scheduling algorithm; System testing; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location :
Marina Del Rey, CA
Print_ISBN :
0-7695-1122-8
Type :
conf
DOI :
10.1109/VTS.2001.923464
Filename :
923464
Link To Document :
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