• DocumentCode
    3107202
  • Title

    Precedence-based, preemptive, and power-constrained test scheduling for system-on-a-chip

  • Author

    Iyengar, Vikram ; Chakrabarty, Krishnendu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    368
  • Lastpage
    374
  • Abstract
    Test scheduling is a major problem in system-on-a-chip (SOC) test automation. We present an integrated framework that addresses several important test scheduling problems. We first present efficient techniques to determine optimal SOC test schedules with precedence constraints, i.e., schedules that preserve desirable orderings among tests. We then present a new algorithm that uses preemption to obtain optimal test schedules in polynomial time. Finally, we present a new method for determining optimal power-constrained schedules. Experimental results for a representative SOC show that test schedules can be obtained in reasonable CPU time for all cases
  • Keywords
    application specific integrated circuits; automatic testing; integrated circuit testing; low-power electronics; scheduling; CPU time; polynomial time; power-constrained test scheduling; precedence constraints; system-on-a-chip; test automation; test scheduling problems; Automatic testing; Built-in self-test; Engines; Job shop scheduling; Power dissipation; Power engineering computing; Processor scheduling; Scheduling algorithm; System testing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
  • Conference_Location
    Marina Del Rey, CA
  • Print_ISBN
    0-7695-1122-8
  • Type

    conf

  • DOI
    10.1109/VTS.2001.923464
  • Filename
    923464