DocumentCode
3107202
Title
Precedence-based, preemptive, and power-constrained test scheduling for system-on-a-chip
Author
Iyengar, Vikram ; Chakrabarty, Krishnendu
Author_Institution
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
fYear
2001
fDate
2001
Firstpage
368
Lastpage
374
Abstract
Test scheduling is a major problem in system-on-a-chip (SOC) test automation. We present an integrated framework that addresses several important test scheduling problems. We first present efficient techniques to determine optimal SOC test schedules with precedence constraints, i.e., schedules that preserve desirable orderings among tests. We then present a new algorithm that uses preemption to obtain optimal test schedules in polynomial time. Finally, we present a new method for determining optimal power-constrained schedules. Experimental results for a representative SOC show that test schedules can be obtained in reasonable CPU time for all cases
Keywords
application specific integrated circuits; automatic testing; integrated circuit testing; low-power electronics; scheduling; CPU time; polynomial time; power-constrained test scheduling; precedence constraints; system-on-a-chip; test automation; test scheduling problems; Automatic testing; Built-in self-test; Engines; Job shop scheduling; Power dissipation; Power engineering computing; Processor scheduling; Scheduling algorithm; System testing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location
Marina Del Rey, CA
Print_ISBN
0-7695-1122-8
Type
conf
DOI
10.1109/VTS.2001.923464
Filename
923464
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