DocumentCode :
3107262
Title :
Tools for the characterization of bipolar CML testability
Author :
Monte, Ginette ; Antaki, Bernard ; Patenaude, Serge ; Savaria, Yvon ; Thibeault, Claude ; Trouborst, Pieter
Author_Institution :
Ecole Polytech., Montreal, Que., Canada
fYear :
2001
fDate :
2001
Firstpage :
388
Lastpage :
395
Keywords :
Application specific integrated circuits; Automatic logic units; Circuit analysis; Circuit faults; Circuit simulation; Costs; Design for testability; Libraries; Logic testing; Statistical analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Print_ISBN :
0-7695-1122-8
Type :
conf
DOI :
10.1109/VTS.2001.923467
Filename :
923467
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3107262
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