• DocumentCode
    3107313
  • Title

    Author index

  • fYear
    2001
  • fDate
    3-3 May 2001
  • Firstpage
    416
  • Lastpage
    417
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
  • Conference_Location
    Marina Del Rey, CA, USA
  • Print_ISBN
    0-7695-1122-8
  • Type

    conf

  • DOI
    10.1109/VTS.2001.923470
  • Filename
    923470