DocumentCode
3107462
Title
Typical defects of PV-cells
Author
Acciani, G. ; Falcone, O. ; Vergura, S.
Author_Institution
Dept. of Electrotechnics, Politec. di Bari, Bari, Italy
fYear
2010
fDate
4-7 July 2010
Firstpage
2745
Lastpage
2749
Abstract
The paper introduces the issue of the typical defects in PhotoVoltaic (PV) cells and focuses the attention on two specific defects: linear edge shunt and hole. These defects are modeled by means of Finite Element Method (FEM) and implemented in Comsol Multiphysics environment in order to analyze the temperature distribution in the whole defected PV-cell. Usually the defects reveal themselves as hot spots and can be pointed out by means of thermo-graphy. Simulation results are compared with the thermo-grams of real cases and the accuracy of the models is confirmed.
Keywords
finite element analysis; infrared imaging; photovoltaic cells; temperature distribution; PV cells; finite element method; hole defects; linear edge shunt defects; photovoltaic cells; temperature distribution; thermography; Conductivity; Finite element methods; Materials; Numerical models; Photovoltaic cells; Simulation; Solid modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics (ISIE), 2010 IEEE International Symposium on
Conference_Location
Bari
Print_ISBN
978-1-4244-6390-9
Type
conf
DOI
10.1109/ISIE.2010.5636901
Filename
5636901
Link To Document