• DocumentCode
    3107504
  • Title

    Measurement-based worst-case execution time analysis

  • Author

    Wenzel, Ingomar ; Kirner, Raimund ; Rieder, Bernhard ; Puschner, Peter

  • Author_Institution
    Inst. for Comput. Eng., Vienna Univ. of Technol., Austria
  • fYear
    2005
  • fDate
    16-17 May 2005
  • Firstpage
    7
  • Lastpage
    10
  • Abstract
    In the last years the number of electronic control systems has increased significantly. In order to stay competitive more and more functionality is integrated into more and more powerful and complex computer hardware. Due to these advances in control systems engineering new challenges for analyzing the timing behavior of real-time computer systems arise. The two identified main challenges are execution-time modeling of the hardware and the path problem that forbids capturing the worst-case execution time (WCET) by end-to-end measurements due to limits in computational complexity. This work presents the cornerstones of our new measurement-based WCET analysis method that successfully addresses these problems. We clearly identify our research goals and the relevance of our research. Especially, the novel aspects of our approach are emphasized. The conclusion is formed by a brief presentation of an industrial-size case study application.
  • Keywords
    computational complexity; control system analysis computing; industrial control; measurement; real-time systems; computational complexity; electronic control systems; hardware execution-time modeling; industrial-size case study application; measurement-based worst-case execution time analysis; real-time computer system timing behavior; Computational complexity; Control systems; Hardware; Power engineering and energy; Power engineering computing; Power system modeling; Real time systems; Systems engineering and theory; Time measurement; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Technologies for Future Embedded and Ubiquitous Systems, 2005. SEUS 2005. Third IEEE Workshop on
  • Print_ISBN
    0-7695-2357-9
  • Type

    conf

  • DOI
    10.1109/SEUS.2005.12
  • Filename
    1425035