• DocumentCode
    310781
  • Title

    Electron beam and pulsed corona processing of volatile organic compounds and nitrogen oxides

  • Author

    Penetrante, B.M. ; Hsiao, M.C. ; Bardsley, J.N. ; Merritt, B.T. ; Vogtlin, G.E. ; Wallman, P.H. ; Kuthi, A. ; Burkhart, C.P. ; Bayless, J.R.

  • Author_Institution
    Lawrence Livermore Nat. Lab., CA, USA
  • Volume
    1
  • fYear
    1995
  • fDate
    3-6 July 1995
  • Firstpage
    144
  • Abstract
    Electrical discharge reactors are most suitable for processes requiring O radicals. For processes requiring copious amounts of electrons or N atoms, the use of electron beam reactors is generally the best way of minimizing the electrical energy consumption. For many of the volatile organic compounds (VOCs) the authors have investigated, they found that electron beam processing is more energy efficient than pulsed corona processing. For VOCs (such as carbon tetrachloride) that require copious amounts of electrons for their decomposition, electron beam processing is remarkably more energy efficient. For some VOCs, the decomposition process is limited by their reaction rate with the plasma-produced radicals and/or by the occurrence of back reactions. In these cases, the energy consumption can be minimized by operating at high (but noncombusting) temperatures.
  • Keywords
    air pollution control; corona; discharges (electric); electron beam applications; plasma applications; power supplies to apparatus; pulse generators; pulsed power technology; air emissions control; back reactions; decomposition process; electrical energy consumption; electron beam processing; nitrous oxides; plasma-produced radicals; pulsed corona processing; volatile organic compounds; Atomic beams; Atomic measurements; Corona; Electron beams; Energy consumption; Energy efficiency; Inductors; Plasma materials processing; Plasma temperature; Volatile organic compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 1995. Digest of Technical Papers., Tenth IEEE International
  • Conference_Location
    Albuquerque, NM, USA
  • Print_ISBN
    0-7803-2791-8
  • Type

    conf

  • DOI
    10.1109/PPC.1995.596471
  • Filename
    596471