Title :
Analysis on altimeters´ reliability growth test data
Author_Institution :
Beijing Aeronaut. Technol. Res. Center, China
Abstract :
In this paper, two altimeter failure data sets, undergoing reliability growth test under combined environments is analyzed, based on an AMSAA model for multiple item development. The statistical tests show that there is a significant reliability growth, the failure data can be tracked by the AMSAA model, and the altimeter MTBF confidence lower limit is greater than required.
Keywords :
altimeters; failure analysis; reliability; statistical analysis; MTBF confidence lower limit; altimeter failure data analysis; altimeter reliability; multiple item development AMSAA model; reliability growth test data; statistical analysis; Data analysis; Failure analysis; Life estimation; System testing;
Conference_Titel :
Business of Electronic Product Reliability and Liability, 2004 International Conference on
Print_ISBN :
0-7803-8361-3
DOI :
10.1109/BEPRL.2004.1308159
