DocumentCode
3108021
Title
Instantaneous image observation of ultrafast electrical pulse propagating on metal strip
Author
Takeuchi, K. ; Mizuhara, A.
Author_Institution
Teratec Corp., Musashino, Japan
Volume
Supplement
fYear
1996
fDate
5-5 Dec. 1996
Firstpage
29
Abstract
Instantaneous potential distribution of 2 ps propagating pulse was visualized using a scanning force optoelectronic microscope. A special probe made of low temperature grown GaAs is the key in the optical sampling measurement.
Keywords
atomic force microscopy; high-speed optical techniques; optical microscopes; optoelectronic devices; photoconducting switches; probes; 2 ps; GaAs; instantaneous image observation; metal strip; optical sampling measurement; potential distribution; ultrafast electrical pulse; Gallium arsenide; Laser mode locking; Microscopy; Optical films; Optical pulses; Probes; Sampling methods; Strips; Switches; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Photonics, 1996. MWP '96. Technical Digest., 1996 Internatonal Topical Meeting on
Conference_Location
Kyoto, Japan
Print_ISBN
0-7803-3129-X
Type
conf
DOI
10.1109/MWP.1996.660358
Filename
660358
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