• DocumentCode
    310804
  • Title

    Nanosecond electron beam controlled switching

  • Author

    Awrach, J.M. ; Baker, M.C. ; Kristiansen, M. ; Hatfield, L.L. ; Gangopadhyay, S. ; Zinsmeyer, K.

  • Author_Institution
    Dept. of Electr. Eng., Texas Tech. Univ., Lubbock, TX, USA
  • Volume
    1
  • fYear
    1995
  • fDate
    3-6 July 1995
  • Firstpage
    348
  • Abstract
    Results of electron beam controlled switching in zinc selenide (ZnSe), quartz, and preliminary results in sapphire are analyzed. Initial tests yielded indistinguishable data for charging voltages between 0.1 to 1 kV. For later tests, introduction of a ground plane with an opening in front of the sample reduced beam "noise" by an order of magnitude for some ZnSe samples, resulting in data obtained for small charging voltages on the order of 100 V and up. In all cases, switch resistance was drastically reduced in response to the electron beam. The ZnSe switch recovery was exponential, whereas the quartz samples showed nearly instantaneous on/off response to the e-beam. Preliminary sapphire tests showed a switching response to the e-beam.
  • Keywords
    II-VI semiconductors; electron beam applications; power semiconductor switches; pulsed power switches; quartz; sapphire; selenium alloys; zinc alloys; 0.1 to 1 kV; ZnSe; beam noise reduction; charging voltages; electron beam controlled switching; ground plane; instantaneous on/off response; quartz; sapphire; switch resistance; switching response; zinc selenide; Charge carrier density; Contacts; Electron beams; High speed optical techniques; Optical modulation; Optical switches; Testing; Thermal conductivity; Voltage; Zinc compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 1995. Digest of Technical Papers., Tenth IEEE International
  • Conference_Location
    Albuquerque, NM, USA
  • Print_ISBN
    0-7803-2791-8
  • Type

    conf

  • DOI
    10.1109/PPC.1995.596504
  • Filename
    596504