DocumentCode :
3108065
Title :
ECG Denoising Based on the Empirical Mode Decomposition
Author :
Weng, Binwei ; Blanco-Velasco, Manuel ; Barner, Kenneth E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Delaware Univ., Newark, DE
fYear :
2006
fDate :
Aug. 30 2006-Sept. 3 2006
Firstpage :
1
Lastpage :
4
Abstract :
The electrocardiogram (ECG) has been widely used for diagnosis purposes of heart diseases. Good quality ECG are utilized by the physicians for interpretation and identification of physiological and pathological phenomena. However, in real situations, ECG recordings are often corrupted by artifacts. One prominent artifact is the high frequency noise caused by electromyogram induced noise, power line interferences, or mechanical forces acting on the electrodes. Noise severely limits the utility of the recorded ECG and thus need to be removed for better clinical evaluation. Several methods have been developed for ECG denoising. In this paper, we proposed a new ECG denoising method based on the recently developed Empirical Mode Decomposition (EMD). The proposed EMD-based method is able to remove high frequency noise with minimum signal distortion. The method is validated through experiments on the MIT-BIH database. Both quantitative and qualitative results are given. The results show that the proposed method provides very good results for denoising
Keywords :
biomedical electrodes; diseases; electrocardiography; medical information systems; medical signal processing; signal denoising; ECG denoising; ECG recording; MIT-BIH database; electrocardiogram; electrode; electromyogram induced noise; empirical mode decomposition; heart disease; pathological phenomena; patient diagnosis; power line interference; Cardiac disease; Cities and towns; Databases; Electrocardiography; Frequency; Interference; Noise reduction; Signal processing; Spline; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
ISSN :
1557-170X
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2006.259340
Filename :
4461668
Link To Document :
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