Title :
ESD Protection Design And Applications To Bidirectional Antenna Protection For Sub-5 nm Gate Oxides
Author :
Amerasekera, Ajith ; Krishnan, Srikanth
Author_Institution :
Texas Instruments Incorporated
Keywords :
Biological system modeling; CMOS technology; Circuit testing; Electrostatic discharge; Humans; Integrated circuit testing; Physics; Protection; Pulse circuits; Voltage;
Conference_Titel :
Plasma Process-Induced Damage, 1997., 2nd International Symposium on
Conference_Location :
Monterey, California, USA
Print_ISBN :
0-9651-5771-7
DOI :
10.1109/PPID.1997.596676
