DocumentCode :
310855
Title :
Assessing Processing Induced Darnage Using Cyclic I-V Analysis
Author :
Okandan, Murat ; Merritt, Mitch ; Fonash, Stephen
Author_Institution :
The Pennsylvania State University
fYear :
1997
fDate :
13-14 May 1997
Firstpage :
105
Lastpage :
108
Keywords :
Buildings; Charge carrier lifetime; Current measurement; Energy measurement; Interface states; Laboratories; Magnetic resonance imaging; Monitoring; Stress measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Process-Induced Damage, 1997., 2nd International Symposium on
Conference_Location :
Monterey, California, USA
Print_ISBN :
0-9651-5771-7
Type :
conf
DOI :
10.1109/PPID.1997.596708
Filename :
596708
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=310855
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