• DocumentCode
    3108594
  • Title

    Thermal characterization of organic light emitting devices

  • Author

    Chan, P.K.L.

  • Author_Institution
    Dept. of Mech. Eng, Hong Kong Polytech. Univ., Hong Kong, China
  • fYear
    2009
  • fDate
    13-17 July 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    CCD-based thermoreflectance is applied on organic light emitting devices to investigate the temperature distribution along the device surface under different bias conditions. This technique can provide useful information on understanding the device degradation mechanism.
  • Keywords
    charge-coupled devices; light emitting devices; organic light emitting diodes; temperature distribution; thermoreflectance; device degradation; organic light emitting devices; temperature distribution; thermoreflectance; Electrodes; Mechanical engineering; Optical surface waves; Organic electronics; Organic light emitting diodes; Scanning electron microscopy; Substrates; Temperature distribution; Thermal degradation; Thermoreflectance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    OptoElectronics and Communications Conference, 2009. OECC 2009. 14th
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-4102-0
  • Electronic_ISBN
    978-1-4244-4103-7
  • Type

    conf

  • DOI
    10.1109/OECC.2009.5213782
  • Filename
    5213782