DocumentCode
3108594
Title
Thermal characterization of organic light emitting devices
Author
Chan, P.K.L.
Author_Institution
Dept. of Mech. Eng, Hong Kong Polytech. Univ., Hong Kong, China
fYear
2009
fDate
13-17 July 2009
Firstpage
1
Lastpage
2
Abstract
CCD-based thermoreflectance is applied on organic light emitting devices to investigate the temperature distribution along the device surface under different bias conditions. This technique can provide useful information on understanding the device degradation mechanism.
Keywords
charge-coupled devices; light emitting devices; organic light emitting diodes; temperature distribution; thermoreflectance; device degradation; organic light emitting devices; temperature distribution; thermoreflectance; Electrodes; Mechanical engineering; Optical surface waves; Organic electronics; Organic light emitting diodes; Scanning electron microscopy; Substrates; Temperature distribution; Thermal degradation; Thermoreflectance;
fLanguage
English
Publisher
ieee
Conference_Titel
OptoElectronics and Communications Conference, 2009. OECC 2009. 14th
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-4102-0
Electronic_ISBN
978-1-4244-4103-7
Type
conf
DOI
10.1109/OECC.2009.5213782
Filename
5213782
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