Title :
Thermal characterization of organic light emitting devices
Author_Institution :
Dept. of Mech. Eng, Hong Kong Polytech. Univ., Hong Kong, China
Abstract :
CCD-based thermoreflectance is applied on organic light emitting devices to investigate the temperature distribution along the device surface under different bias conditions. This technique can provide useful information on understanding the device degradation mechanism.
Keywords :
charge-coupled devices; light emitting devices; organic light emitting diodes; temperature distribution; thermoreflectance; device degradation; organic light emitting devices; temperature distribution; thermoreflectance; Electrodes; Mechanical engineering; Optical surface waves; Organic electronics; Organic light emitting diodes; Scanning electron microscopy; Substrates; Temperature distribution; Thermal degradation; Thermoreflectance;
Conference_Titel :
OptoElectronics and Communications Conference, 2009. OECC 2009. 14th
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-4102-0
Electronic_ISBN :
978-1-4244-4103-7
DOI :
10.1109/OECC.2009.5213782
