Title :
A procedure for measurement of s-parameters and eye-diagram of backplane using two-port VNA
Author :
Hoffmann, Karel ; Randus, M.
Author_Institution :
Czech Tech. Univ. in Prague, Prague, Czech Republic
Abstract :
A procedure for measurement of eye-diagram of a backplane based on single-ended two port s-parameters was designed and experimentally verified. Eye-diagram was derived using impulse response corresponding to calculated differential s-parameters of backplane pair lines. FCI AirMax VS connectors were used to connect the backplane. The procedure was verified in frequency band up to 5 GHz and transmission rate 1.25 Gbits/s.
Keywords :
S-parameters; electromagnetic wave transmission; microwave measurement; transient response; backplane pair lines; differential s-parameters; eye-diagram; frequency band up; impulse response; s-parameters measurement; transmission rate; two-port VNA; Backplanes; Calibration; Connectors; Fixtures; Microwave measurements; Scattering parameters; Standards; Microwave measurement; back plane; differential measurement; eye-diagram; mixed mode parameters; vector network analyzer;
Conference_Titel :
Microwave Measurement Symposium (ARFTG), 2012 80th ARFTG
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-4817-1
Electronic_ISBN :
978-1-4673-4820-1
DOI :
10.1109/ARFTG.2012.6422421
