DocumentCode :
3108704
Title :
Folded planar Marchand balun with improved isolation for radio frequency Automated Test Equipment applications
Author :
Montiel, Claudio M.
Author_Institution :
Texas A&M Univ.-Kingsville, Kingsville, TX, USA
fYear :
2012
fDate :
29-30 Nov. 2012
Firstpage :
1
Lastpage :
3
Abstract :
This paper describes a folded planar Marchand balun with an isolation circuit. The circuit is proposed for use in efficient, low-cost, high-volume Automated Test Equipment (ATE) solutions. Many radio designs use radio-frequency integrated circuits (RFICs) with differential inputs or outputs to reduce the effects of common-mode noise or interference. Most RF ATEs, however, only provide single-ended inputs and outputs; consequently a balun is necessary in the device interface board (DIB). The Marchand balun has been a popular circuit since its introduction because it has larger bandwidth than other types of combiners and because it can be simultaneously be used as an impedance transformer. Unfortunately, the Marchand balun suffers from poor isolation and impedance matching at the output port. To improve the performance of the Marchand balun, a compact isolation circuit was designed. The balun shows improved impedance match at the output port with a slight reduction in bandwidth.
Keywords :
automatic test equipment; baluns; impedance convertors; impedance matching; interference suppression; radiofrequency integrated circuits; DIB; RFIC; common-mode noise reduction; compact isolation circuit; device interface board; folded planar Marchand balun; high-volume ATE solutions; impedance matching; impedance transformer; interference reduction; radio designs; radiofrequency automated test equipment applications; radiofrequency integrated circuits; Bandwidth; Educational institutions; Impedance; Impedance matching; Radio frequency; Radiofrequency integrated circuits; Simulation; Marchand Balun; automatic test equipment; device interface board; impedance transformer; isolation circuit; printed circuits; scattering parameters measurement; simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Symposium (ARFTG), 2012 80th ARFTG
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-4817-1
Electronic_ISBN :
978-1-4673-4820-1
Type :
conf
DOI :
10.1109/ARFTG.2012.6422426
Filename :
6422426
Link To Document :
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