• DocumentCode
    3108797
  • Title

    System Theory in Medical Diagnostic Devices: An Overview

  • Author

    Baura, Gail D.

  • Author_Institution
    CardioDynamics, San Diego, CA
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    137
  • Lastpage
    139
  • Abstract
    Medical diagnostics refers to testing conducted either in vitro or in vivo to provide critical health care information for risk assessment, early diagnosis, treatment, or disease management. Typical in vivo diagnostic tests include the computed tomography scan, magnetic resonance imaging, and blood pressure screening. Typical in vitro diagnostic tests include cholesterol, Papanicolaou smear, and conventional glucose monitoring tests. Historically, devices associated with both types of diagnostics have used heuristic curve fitting during signal analysis. However, since the early 1990s, a few enterprising engineers and physicians have used system theory to improve their core processing for feature detection and system identification. Current applications include automated Pap smear screening for detection of cervical cancer and diagnosis of Alzheimer´s disease. Future applications, such as disease prediction before symptom onset and drug treatment customization, have been catalyzed by the Human Genome Project
  • Keywords
    biomedical equipment; biomedical imaging; diseases; Alzheimer´s disease diagnosis; Papanicolaou smear screening; blood pressure screening; cervical cancer detection; cholesterol; computed tomography scan; glucose monitoring tests; health care information; in vitro diagnostic tests; in vivo diagnostic tests; magnetic resonance imaging; medical diagnostic devices; risk assessment; signal analysis; system theory; Alzheimer´s disease; Computed tomography; In vitro; In vivo; Medical diagnosis; Medical services; Medical tests; Medical treatment; Risk management; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.259653
  • Filename
    4461703