DocumentCode :
3109290
Title :
SPITFIRE: scalable parallel algorithms for test set partitioned fault simulation
Author :
Krishnaswamy, Dilip ; Rudnick, Elizabeth M. ; Patel, Janak H. ; Banerjee, Prithviraj
Author_Institution :
Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
fYear :
1997
fDate :
27 Apr-1 May 1997
Firstpage :
274
Lastpage :
281
Abstract :
We propose three synchronous parallel algorithms for scalable parallel test set partitioned fault simulation. The algorithms are based on a new two-stage approach to parallelizing fault simulation for sequential VLSI circuits in which the test set is partitioned among the available processors, The test set partitioning inherent in the algorithms overcomes the good circuit logic simulation bottleneck that exists in traditional fault partitioned approaches to parallel fault simulation. The implementations were done on a shared memory multiprocessor and on a network of workstations. Two of the algorithms show a small degree of pessimism in a few cases, with respect to the fault coverage as compared with a uniprocessor run, while the third algorithm provides the same results as in a uniprocessor run. All algorithms provide excellent speedups and perform much better than a traditional fault partitioned approach, on both shared and distributed memory parallel platforms
Keywords :
VLSI; automatic test software; fault diagnosis; integrated circuit testing; integrated logic circuits; logic testing; parallel algorithms; sequential circuits; SPITFIRE; fault coverage; scalable parallel algorithms; sequential VLSI circuits; synchronous parallel algorithms; test set partitioned fault simulation; Circuit faults; Circuit simulation; Circuit testing; Logic testing; Parallel algorithms; Partitioning algorithms; Sequential analysis; Sequential circuits; Very large scale integration; Workstations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location :
Monterey, CA
ISSN :
1093-0167
Print_ISBN :
0-8186-7810-0
Type :
conf
DOI :
10.1109/VTEST.1997.600663
Filename :
600663
Link To Document :
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