Experimental dielectric sensing of materials using Epsilon-Near-Zero tunnel in SIW technology

Author

Lobato-Morales, Humberto ; Corona-Chavez, Alonso ; Murthy, D.V.B. ; Martinez-Brito, J. ; Guerrero-Ojeda, L.G.

Author_Institution

Nat. Inst. for Astrophys., Opt. & Electron., Puebla, Mexico

fYear

2010

fDate

23-28 May 2010

Firstpage

1644

Lastpage

1647

Abstract

A planar Epsilon-Near-Zero (ENZ) structure implemented on substrate integrated waveguide technology is used for the characterization of material dielectric permittivity. The proposed structure has very high sensitivity which yields more accurate results when compared to other techniques, such as perturbation of conventional cavities. This prototype presents a low profile, low cost, ease of fabrication and ease of integration, which add important characteristics for portable material analysis systems. Measurements are in good agreement with standard values.

Keywords

microwave detectors; microwave measurement; permittivity measurement; substrate integrated waveguides; Epsilon-near-zero tunnel; SIW technology; dielectric sensing; material dielectric permittivity; microwave measurement; permittivity measurement; portable material analysis system; substrate integrated waveguide technology; Cutoff frequency; Dielectric materials; Dielectric measurements; Dielectric substrates; Extraterrestrial measurements; Fabrication; Microwave measurements; Permittivity measurement; Rectangular waveguides; Tunneling; Epsilon-Near-Zero; microwave measurements; permittivity measurements; plasmonic structure; substrate integrated waveguide;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International

Conference_Location

Anaheim, CA

ISSN

0149-645X

Print_ISBN

978-1-4244-6056-4

Electronic_ISBN

0149-645X

Type

conf

DOI

10.1109/MWSYM.2010.5515893

Filename

5515893