Title :
Experimental dielectric sensing of materials using Epsilon-Near-Zero tunnel in SIW technology
Author :
Lobato-Morales, Humberto ; Corona-Chavez, Alonso ; Murthy, D.V.B. ; Martinez-Brito, J. ; Guerrero-Ojeda, L.G.
Author_Institution :
Nat. Inst. for Astrophys., Opt. & Electron., Puebla, Mexico
Abstract :
A planar Epsilon-Near-Zero (ENZ) structure implemented on substrate integrated waveguide technology is used for the characterization of material dielectric permittivity. The proposed structure has very high sensitivity which yields more accurate results when compared to other techniques, such as perturbation of conventional cavities. This prototype presents a low profile, low cost, ease of fabrication and ease of integration, which add important characteristics for portable material analysis systems. Measurements are in good agreement with standard values.
Keywords :
microwave detectors; microwave measurement; permittivity measurement; substrate integrated waveguides; Epsilon-near-zero tunnel; SIW technology; dielectric sensing; material dielectric permittivity; microwave measurement; permittivity measurement; portable material analysis system; substrate integrated waveguide technology; Cutoff frequency; Dielectric materials; Dielectric measurements; Dielectric substrates; Extraterrestrial measurements; Fabrication; Microwave measurements; Permittivity measurement; Rectangular waveguides; Tunneling; Epsilon-Near-Zero; microwave measurements; permittivity measurements; plasmonic structure; substrate integrated waveguide;
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2010.5515893
