DocumentCode
3109356
Title
Implementation of power optimized VLSI designs for reliable processing using majority circuit
Author
Jose, Dency ; Kumar, P. Nirmal ; Dhas, A. David Naveen
Author_Institution
Dept. of Electron. & Commun. Eng., Anna Univ., Chennai, India
fYear
2013
fDate
13-15 Dec. 2013
Firstpage
1
Lastpage
6
Abstract
Most of the applications require hard real time signal/data processing potentiality for which fast and dedicated VLSI architectures are the best solution. But designing such circuits lead to high occurrences of failure in the system. Hence there is a critical need for fault tolerance techniques for VLSI designs to increase the reliability of the system. Redundancy techniques are implemented widely to increase the reliability. By developing a fault tolerant system such as Triple Modular Redundancy (TMR), the FPGA can locate the errors and reconfigure the corrupted areas while maintaining the validity of system outputs. One of the drawbacks of this scheme is that the reliability of voter circuit is assumed to be perfect which may not be true. Hence, a novel fault-tolerant voter circuit (NFTVC) have been developed which is more reliable and leads to low power fault tolerant designs. Experimental results show that NFTVC is more reliable than the traditional TMR schemes. The hardware part of the design was done using Spartan-3 kit that is used for a rapid digital circuit. The system performance has been optimized using the Plan Ahead tool in Xilinx in order to reach and maintain the goals of the design. The implementation results provide a simultaneous improvement in power, delay and area.
Keywords
VLSI; fault tolerance; field programmable gate arrays; integrated circuit design; integrated circuit reliability; logic design; redundancy; FPGA; NFTVC; Plan Ahead tool; Spartan-3 kit; TMR; VLSI designs; Xilinx; fault tolerance technique; fault tolerant system; majority circuit; novel fault tolerant voter circuit; power optimization; rapid digital circuit; triple modular redundancy technique; voter circuit reliability; Circuit faults; Fault tolerant systems; Integrated circuit reliability; Redundancy; Tunneling magnetoresistance; VLSI; fault tolerance; low power; novel fault-tolerant voter circuit; reliability; triple modular redundancy;
fLanguage
English
Publisher
ieee
Conference_Titel
India Conference (INDICON), 2013 Annual IEEE
Conference_Location
Mumbai
Print_ISBN
978-1-4799-2274-1
Type
conf
DOI
10.1109/INDCON.2013.6725948
Filename
6725948
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