DocumentCode
3109753
Title
Integrating Data, Models, and Reasoning in Critical Care
Author
Heldt, Thomas ; Long, Bill ; Verghese, George C. ; Szolovits, Peter ; Mark, Roger G.
Author_Institution
Lab. for Electromagn. & Electron. Syst., Massachusetts Inst. of Technol., Cambridge, MA
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
350
Lastpage
353
Abstract
Modern intensive care units (ICUs) employ an impressive array of technologically sophisticated instrumentation to provide detailed measurements of the pathophysiological state of each patient. Providing life support in the ICU is becoming an increasingly complex task, however, because of the growing volume of relevant data from clinical observations, bedside monitors, mechanical ventilators, and a wide variety of laboratory tests and imaging studies. The enormous amount of ICU data and its poor organization makes its integration and interpretation time-consuming and inefficient. There is a critical need to integrate the disparate clinical information into a single, rational framework and to provide the clinician with hypothesis-driven displays that succinctly summarize a patient´s trajectory over time. In this paper, we present our recent efforts towards the development of such an advanced patient monitoring system that aims to improve the efficiency, accuracy, and timeliness of clinical decision making in intensive care
Keywords
biomedical equipment; patient care; patient monitoring; bedside monitors; clinical decision making; clinical information; clinical observations; data integration; hypothesis-driven displays; intensive care units; laboratory tests; mechanical ventilators; pathophysiological state; patient monitoring system; Biomedical measurements; Biomedical monitoring; Decision making; Feature extraction; Instruments; Laboratories; NASA; Patient monitoring; Pattern recognition; Signal generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.259734
Filename
4461757
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