DocumentCode
3109874
Title
A dual branch Hammerstein-Wiener architecture for behavior modeling of wideband RF transmitters
Author
Ghannouchi, Fadhel M. ; Taringou, Farzaneh ; Hammi, Oualid
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Calgary, Calgary, AB, Canada
fYear
2010
fDate
23-28 May 2010
Firstpage
1692
Lastpage
1695
Abstract
This paper proposes a dual branch Hammerstein-Wiener system suitable for behavioral modeling of dynamic nonlinear RF power amplifiers and transmitters. The model consists of a Hammerstein system in parallel with a Wiener system. The model performances in time and frequency domains are experimentally evaluated for a 3G high power Doherty amplifier driven by multi-carrier WCDMA signals. For various orders, the performances of the proposed dual branch Hammerstein-Wiener model are benchmarked against those of the Hammerstein model, Wiener model, and the well established memory polynomial model. The proposed dual branch model achieves better performance than single branch Wiener and Hammerstein models with higher number of coefficients. Furthermore, it leads to normalized mean square error performance comparable to that of the memory polynomial model while requiring 30% to 40% less coefficients.
Keywords
code division multiple access; integrated circuit modelling; mean square error methods; polynomials; power amplifiers; radio transmitters; radiofrequency amplifiers; 3G high power Doherty amplifier; Hammerstein system; Wiener system; behavior modeling; dual branch Hammerstein-Wiener architecture; dynamic nonlinear RF power amplifiers; mean square error; memory polynomial model; multi-carrier WCDMA signals; wideband RF transmitters; Broadband amplifiers; Nonlinear dynamical systems; Performance evaluation; Polynomials; Power amplifiers; Power system modeling; Radio frequency; Radiofrequency amplifiers; Transmitters; Wideband; Behavioral modeling; Hammerstein model; Wiener Model; memory effects; power amplifiers;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location
Anaheim, CA
ISSN
0149-645X
Print_ISBN
978-1-4244-6056-4
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2010.5515921
Filename
5515921
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