Title :
A high level approach to integrating design and test
Author_Institution :
Cadence Design Syst., San Jose, CA, USA
Abstract :
The STL simulation and test language described provides a high-level approach to the problem of integrating design and test. This common programming language and environment can be used by both designers and test engineers to develop functional tests for both simulators and testers. The STL programming environment can be effectively used to increase the productivity of both designers and test engineers. The use of this common language can help to break down some of the traditional barriers that exist between design and test groups
Keywords :
automatic testing; circuit CAD; electronic engineering computing; STL programming environment; STL simulation; automatic testing; circuit CAD; common language; test language; Circuit simulation; Circuit testing; Computer aided engineering; Computer languages; Design engineering; Integrated circuit testing; Power engineering and energy; Rivers; Software testing; System testing;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207756
