DocumentCode :
3110109
Title :
A strategy for generating functional tests from device simulations
Author :
Merritt, Cristopher
Author_Institution :
Megatest Corp., San Jose, CA, USA
fYear :
1988
fDate :
12-14 Sep 1988
Firstpage :
466
Lastpage :
474
Abstract :
A general strategy is presented for generating functional tests (cycle and waveform definitions, timing, and vectors) from device simulations using the Lisp language. The design of a translator which uses this strategy is described. To generate a functional test from a given simulation the translator requires a cycle template for each transaction types represented in the simulation. Through evaluation of the cycle templates, the translator identifies transactions within the simulation and generates corresponding tester cycles. The translator requires a declaration of the device pins involved in the simulation. This declaration, called a pintree, is a Lisp expression which declares the device pins and organizes them hierarchically
Keywords :
LISP; automatic testing; digital simulation; electronic engineering computing; electronic equipment testing; Lisp language; automatic testing; cycle template; declaration; device pins; device simulations; functional tests; pintree; tester cycles; timing; vectors; waveform; Computational modeling; Computer simulation; Design automation; Modems; Pins; Test equipment; Testing; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-8186-0870-6
Type :
conf
DOI :
10.1109/TEST.1988.207758
Filename :
207758
Link To Document :
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