DocumentCode
3110176
Title
Contactors for testing at high frequencies
Author
Riechelmann, Bernd
Author_Institution
SYM-TEK Syst. Inc., San Diego, CA, USA
fYear
1988
fDate
12-14 Sep 1988
Firstpage
500
Lastpage
501
Abstract
A review is presented of the contactor in testing of high-speed ICs. The contactor, which establishes temporary connections to the leads of the device under test (DUT), must not impair the electrical performance of the DUT. In addition, it must have mechanical and thermal characteristics suitable for automatic environmental handling. The author concludes that although the ideal or perfect test contactor does not yet exist, contactor design is keeping pace with advances in the integrated-circuit industry
Keywords
automatic testing; contactors; integrated circuit testing; IC testing; automatic environmental handling; contactor; device under test; electrical performance; high frequencies; high-speed ICs; integrated-circuit industry; mechanical characteristics; testing; thermal characteristics; Capacitors; Circuit testing; Conductors; Contact resistance; Contactors; Electronic equipment testing; Frequency; Impedance; Power transmission lines; Surges;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-8186-0870-6
Type
conf
DOI
10.1109/TEST.1988.207762
Filename
207762
Link To Document