Title :
Contactors for testing at high frequencies
Author :
Riechelmann, Bernd
Author_Institution :
SYM-TEK Syst. Inc., San Diego, CA, USA
Abstract :
A review is presented of the contactor in testing of high-speed ICs. The contactor, which establishes temporary connections to the leads of the device under test (DUT), must not impair the electrical performance of the DUT. In addition, it must have mechanical and thermal characteristics suitable for automatic environmental handling. The author concludes that although the ideal or perfect test contactor does not yet exist, contactor design is keeping pace with advances in the integrated-circuit industry
Keywords :
automatic testing; contactors; integrated circuit testing; IC testing; automatic environmental handling; contactor; device under test; electrical performance; high frequencies; high-speed ICs; integrated-circuit industry; mechanical characteristics; testing; thermal characteristics; Capacitors; Circuit testing; Conductors; Contact resistance; Contactors; Electronic equipment testing; Frequency; Impedance; Power transmission lines; Surges;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207762
