Title :
Integrated pin electronics for a VLSI test system
Author :
Branson, Chris ; Murray, Don ; Sullivan, Steve
Author_Institution :
Tektronix Inc., Beaverton, OR, USA
Abstract :
Drivers, comparators, active loads, and per-pin timing circuitry for a VLSI test system are placed in two CMOS integrated circuits. This level of integration allows fast, low-capacitance pin electronics to be manufactured at relatively low cost. Novel design and calibration techniques are used to overcome limitations of CMOS technology
Keywords :
CMOS integrated circuits; VLSI; calibration; integrated circuit technology; test equipment; CMOS integrated circuits; IC technology; VLSI test system; active loads; calibration; comparators; drivers; integrated pin electronics; low-capacitance pin electronics; per-pin timing circuitry; CMOS integrated circuits; CMOS technology; Circuit testing; Driver circuits; Electronic equipment testing; Integrated circuit testing; Manufacturing; System testing; Timing; Very large scale integration;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207776
