Title :
Practical production testing of ISDN circuit boards
Author :
McAuliffe, Robert E.
Author_Institution :
Hewlett-Packard Co., Loveland, CO, USA
Abstract :
Integrated-services digital network (ISDN) circuit board fault mechanisms, ISDN device attributes, and test equipment requirements are examined. ISDNs required a high level of integration which causes an increase in digital/analog VLSI faults and perfect board faults (faults in the S-bus interface and voice interface clusters). These faults can be detected by supplementing the in-circuit test with cluster specification or edge connector specification tests. These specification tests can be broken into three categories: digital VLSI tests; S-bus cluster tests; and voice cluster tests. The author discusses the testing challenges that are unique to ISDN circuit boards. The discussion takes into account previous studies of test effectiveness, classical testing theory, and real-world ISDN testing experience
Keywords :
ISDN; VLSI; digital integrated circuits; fault location; integrated circuit testing; printed circuit testing; production testing; ISDN circuit boards; S-bus cluster tests; S-bus interface; cluster specification; digital VLSI tests; digital/analog VLSI faults; edge connector specification tests; in-circuit test; production testing; test effectiveness; voice interface clusters; Circuit faults; Circuit testing; Connectors; Electrical fault detection; Fault detection; ISDN; Printed circuits; Production; Test equipment; Very large scale integration;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207778
