• DocumentCode
    3110317
  • Title

    Cygnus PFL switch jitter

  • Author

    Mitton, C. ; Corrow, G. ; Hansen, M. ; Henderson, D. ; Nelson, D. ; Ormond, E. ; Cordova, S. ; Molina, I. ; Smith, J.

  • Author_Institution
    National Security Technologies, 2621 Losee Rd., North Las Vegas, NV 89030 USA
  • Volume
    1
  • fYear
    2007
  • fDate
    17-22 June 2007
  • Firstpage
    415
  • Lastpage
    419
  • Abstract
    The Cygnus Dual Beam Radiographic Facility consists of two identical radiographic sources: Cygnus 1 and Cygnus 2. Each source has the following X-ray output: 1-mm diameter spot size, 4 rads at 1 m, 50-ns full-width-half-maximum. The diode pulse has the following electrical specifications: 2.25 MV, 60 kA, 60 ns. This Radiographic Facility is located in an underground tunnel test area at the Nevada Test Site (NTS). The sources were developed to produce high-resolution images on subcritical tests performed at NTS. Subcritical tests are single-shot, high-value events. For this application, it is desirable to maintain a high level of reproducibility in source output. The major components of the Cygnus machines are Marx generator, water-filled pulse forming line (PFL), water-filled coaxial transmission line, three-cell inductive voltage adder, and rod-pinch diode. A primary source of fluctuation in Cygnus shot-to-shot performance may be jitter in breakdown of the main PFL switch, which is a “self-break” switch. The PFL switch breakdown time determines the peak PFL charging voltage, which ultimately affects the source X-ray spectrum and dose. Therefore, PFL switch jitter may contribute to shot-to-shot variation in these parameters, which are crucial to radiographic quality. In this paper we will present PFL switch jitter analysis for both Cygnus machines and present the correlation with dose. For this analysis, the PFL switch on each machine was maintained at a single gap setting, which has been used for the majority of shots at NTS. In addition the PFL switch performance for one larger switch gap setting will be examined.
  • Keywords
    Breakdown voltage; Coaxial components; Diodes; Jitter; Performance evaluation; Pulse generation; Radiography; Reproducibility of results; Switches; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 2007 16th IEEE International
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    978-1-4244-0913-6
  • Electronic_ISBN
    978-1-4244-0914-3
  • Type

    conf

  • DOI
    10.1109/PPPS.2007.4651871
  • Filename
    4651871