DocumentCode
3110321
Title
Fault isolation in grey systems
Author
Su, Stephen Y H ; Ma, Hede
Author_Institution
State Univ. of New York, Binghamton, NY, USA
fYear
1988
fDate
12-14 Sep 1988
Firstpage
54
Lastpage
63
Abstract
The concepts of grey, white, and black systems are formally introduced and developed into logic testing area, i.e. the area of error detection and fault isolation, to find a direction to establish more efficient test schemes for testing digital systems at a reasonable cost. A probabilistic isolation strategy realized by a heuristic and decision-making algorithm is presented to isolate faults in grey systems efficiently in terms of computation space and time
Keywords
automatic test equipment; error detection; fault location; integrated logic circuits; logic testing; probability; ATE; computation space; computation time; decision-making algorithm; error detection; fault isolation; grey systems; heuristic algorithm; logic testing; probabilistic isolation strategy; Circuit faults; Circuit testing; Costs; Decision making; Digital systems; Fault detection; Integrated circuit interconnections; Integrated circuit testing; Logic testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-8186-0870-6
Type
conf
DOI
10.1109/TEST.1988.207780
Filename
207780
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