DocumentCode
3110340
Title
Analysis of experimental results on functional testing and diagnosis of complex circuits
Author
Bellon, C. ; Velazco, R. ; Ziade, H.
Author_Institution
Lab. de Genie Inf., Grenoble, France
fYear
1988
fDate
12-14 Sep 1988
Firstpage
64
Lastpage
72
Abstract
A number of functional-level test approaches for microprocessors have been proposed. The GAPT approach, presented here, is a pragmatic one, but it is supported by a set of tools and experimental results. The authors describe the GAPT approach in detail. They draw tentative conclusions with respect to the effectiveness and scope of these functional test generation methods
Keywords
VLSI; automatic testing; integrated circuit testing; microprocessor chips; IC testing; VLSI; automatic testing; diagnosis of complex circuits; functional testing; microprocessor chips; microprocessors; Circuit faults; Circuit testing; Error correction; Failure analysis; Microprocessors; Programmable circuits; Software testing; Software tools; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-8186-0870-6
Type
conf
DOI
10.1109/TEST.1988.207781
Filename
207781
Link To Document