DocumentCode
3110457
Title
Identification of system dynamics in presence of measurement noise
Author
Pandey, Shishir ; Majhi, S.
Author_Institution
Dept. of Electron. & Electr. Eng., Indian Inst. of Technol. Guwahati, Guwahati, India
fYear
2013
fDate
13-15 Dec. 2013
Firstpage
1
Lastpage
6
Abstract
A technique for identification of system dynamics under the influence of measurement noise is presented. When output signal from sensor is corrupted by noise, identification of system parameters become an arduous task. Therefore, denoising methods can be employed in order to achieve a clean limit cycle under noisy environment. A Fast Fourier Transform (FFT) method has been reported as an effective technique for the mitigation of noise by an appropriate thresholding. Generalized explicit expressions are examined to obtain unknown plant model parameters for stable and unstable First Order Plus Dead Time (FOPDT) processes. Examples are illustrated to show the effectiveness of method during parametric identification of process models. Subsequently, a comparison is drawn between estimated and actual system through simulation by step test and Nyquist plot.
Keywords
fast Fourier transforms; identification; signal denoising; FFT method; FOPDT processes; Nyquist plot; clean limit cycle; denoising methods; fast Fourier transform; generalized explicit expressions; measurement noise; noisy environment; output signal; parametric identification; plant model parameters; process models; sensor; system dynamics; thresholding; unstable first order plus dead time processes; Limit-cycles; Mathematical model; Noise; Noise measurement; Pollution measurement; Relays; Transfer functions; AWGN; Asymmetrical Relay; FFT; FOPDT; Identification;
fLanguage
English
Publisher
ieee
Conference_Titel
India Conference (INDICON), 2013 Annual IEEE
Conference_Location
Mumbai
Print_ISBN
978-1-4799-2274-1
Type
conf
DOI
10.1109/INDCON.2013.6726001
Filename
6726001
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