DocumentCode
3110480
Title
Software environment for 500-MHz VLSI test system ULTIMATE
Author
Adachi, T. ; Tanno, M. ; Sudo, T.
Author_Institution
LSI Lab., NTT, Kanagawa, Japan
fYear
1988
fDate
12-14 Sep 1988
Firstpage
114
Lastpage
119
Abstract
The software environment of ULTIMATE has been described. Distributed processing by three-layer processors and parallelism of per-pin controllers make it possible to attain high-speed and flexible data processing. Since ULTIMATE is connected to a host computer as a terminal device, users can operate it in the same environment as CAD-application programs. Operationability is thus greatly improved compared with conventional stand-alone testers. This arrangement also results in a powerful fault analysis tool in cooperation with an electron beam tester
Keywords
VLSI; automatic test equipment; automatic testing; integrated circuit testing; programming environments; 500 MHz; ATE; IC testing; ULTIMATE; VLSI test system; fault analysis tool; flexible data processing; parallelism; software environment; three-layer processors; Automatic control; Circuit testing; Control systems; Hardware; Large scale integration; Logic design; Logic testing; Software testing; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-8186-0870-6
Type
conf
DOI
10.1109/TEST.1988.207788
Filename
207788
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