DocumentCode
3110538
Title
Boundary scan with cellular-based built-in self-test
Author
Gloster, Clay S., Jr. ; Brglez, Franc
Author_Institution
North Carolina A&T State Univ., Greensboro, NC, USA
fYear
1988
fDate
12-14 Sep 1988
Firstpage
138
Lastpage
145
Abstract
Boundary scan merging with built-in self-test is discussed. The proposed implementation of boundary scan represents a snapshot of the Joint Test Advisory Group Recommendation 1.0, while the built-in self-test implements the features of cellular automata. Test patterns generated from two distinct sources are examined, one with registers using cellular automata and the other, based on the conventional LFSR (linear-feedback shift register) configuration. Distinctive effects of these patterns on fault coverage of specific designs are analyzed and illustrated
Keywords
automatic testing; fault location; finite automata; logic testing; printed circuit testing; shift registers; PC testing; boundary scan; cellular automata; cellular-based built-in self-test; fault coverage; linear-feedback shift register; logic testing; test patterns; Automatic testing; Built-in self-test; Circuit testing; Connectors; Costs; Packaging; Pattern analysis; Pins; Registers; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-8186-0870-6
Type
conf
DOI
10.1109/TEST.1988.207791
Filename
207791
Link To Document