Title :
Semiconductor perspective on test standards
Author_Institution :
Texas Instrum. Inc., Plano, TX, USA
Abstract :
Developing testable products cost-effectively requires that a standard, such as JTAG and the IEEE P-1149, be adopted. The system developer and semiconductor manufacturer need to share in this development effort to accelerate adoption. The system developer must gain a better understanding of the total cost of ownership for a testable vs. a nontestable product and the semiconductor manufacturer must be willing to provide initial product offerings before a well defined and quantified market exists. Efforts must be put in place to implement standards in software tools and data formats required to support test
Keywords :
automatic testing; measurement standards; production testing; semiconductor device testing; IEEE P-1149; JTAG; cost; data formats; semiconductor manufacturer; software tools; test standards; Circuit testing; Costs; Electronic equipment testing; Electronics industry; Integrated circuit testing; Manufacturing industries; Semiconductor device manufacture; Semiconductor device packaging; Semiconductor device testing; System testing;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207799
