• DocumentCode
    3110847
  • Title

    A Framework for Data Flow in Apparel Supply Chain Using RFID Technology

  • Author

    Wong, Kirk H M ; Chan, Allan C K ; Hui, Patrick C L ; Patel, Chetna A.

  • Author_Institution
    Inst. of Textiles & Clothing, Hong Kong Polytech. Univ., Kowloon
  • fYear
    2006
  • fDate
    16-18 Aug. 2006
  • Firstpage
    61
  • Lastpage
    66
  • Abstract
    Nowadays, automatic data capture or auto identification technology has been booming in the global Textile and Clothing Industries. With the help of radio frequency identification (RFID) technology and the electronic product code (EPC) standards, the services for apparel supply chain will be able to provide data or information about products along different stages of this supply chain. All parts of the apparel supply chain including manufacturers, distributors and retailers will be able to have instant access to information about an individual product at any time. The wide adoption of RFID across the supply chain will bring significant benefits leading to reduced operational costs and hence increase profit. This article mainly concerns on the flow of information by means of data throughout the apparel supply chain and relationship between each of its member in supply chain; entity relation diagram (ERD) is also used to make more understandable of this relationship. Each member or organization represents an entity and relation among each is shown by indicating lines. Furthermore, a preliminary description of an infrastructure for data flows is also outlined for our further research work.
  • Keywords
    clothing industry; data flow analysis; entity-relationship modelling; manufacturing data processing; radiofrequency identification; supply chains; textile industry; EPC; ERD; RFID technology; clothing industries; data flow; electronic product code standards; entity relation diagram; operational cost reduction; radio frequency identification technology; supply chain; textile industries; Clothing industry; Code standards; Costs; Kirk field collapse effect; Manufacturing; Product codes; Radiofrequency identification; Supply chains; Textile industry; Textile technology; Apparel; Data Flow; ERD; RFID; Supply Chain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Informatics, 2006 IEEE International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    0-7803-9700-2
  • Electronic_ISBN
    0-7803-9701-0
  • Type

    conf

  • DOI
    10.1109/INDIN.2006.275718
  • Filename
    4053363