The KARL/KARATE system-automatic test pattern generation based on RT level descriptions

Author

Alfs, Gerold ; Hartenstein, Reiner W. ; Wodtko, Andrea

Author_Institution

Dept. of Comput. Sci., Kaiserslautern Univ., West Germany

fYear

1988

fDate

12-14 Sep 1988

Firstpage

230

Lastpage

235

Abstract

A system is described for automatic test-pattern generation (ATPG) using symbolic representations and heuristics to attack the test problem at RT level, where redesigns to increase the testability are relatively cheap. In contrast to other ATPG tools based on RT-level hardware descriptions, KARATE includes tests for primitive operators and allows the modification and redefinition of fault models. KARATE has been implemented in Pascal on a VAX 11/750. The search algorithm, provisional libraries, and test program generators have been actually implemented and the heuristics included are tested. The final version of the library handler and a special pattern editor, which allows the comfortable specification of patterns, are under development

Keywords

automatic testing; logic testing; software packages; KARL/KARATE system; Pascal; RT level; VAX 11/750; automatic test-pattern generation; heuristics; library handler; logic testing; pattern editor; search algorithm; symbolic representations; testability; Automatic test pattern generation; Circuit faults; Computer science; Graphics; Hardware; Software systems; Switches; Test pattern generators; Testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1988. Proceedings. New Frontiers in Testing, International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-8186-0870-6

Type

conf

DOI

10.1109/TEST.1988.207807

Filename

207807