Title :
Fault detection effectiveness of weighted random patterns
Author :
Waicukauski, J.A. ; Lindbloom, E.
Author_Institution :
IBM Corp., East Fishkill, NY, USA
Abstract :
Performance results are given for use of a weighted random pattern test generator, WRP, on ten benchmark designs. Deterministic (DET) and WRP tests created for single stuck faults are compared in their ability to detect shorts and transition faults. The WRP is able to generate a test for all the single stuck faults detected with a state-of-the-art deterministic pattern generator; WRP is highly efficient in CPU time required for full stuck fault test pattern generation; both DET and WRP achieved high net-to-net shorts fault coverage on a sample of ten designs; and WRP had significantly higher (≈11%) transition fault coverage than obtained with DET for the same sample
Keywords :
automatic testing; fault location; logic testing; random processes; automatic testing; benchmark designs; deterministic pattern generator; logic testing; random pattern test generator; shorts; single stuck faults; transition faults; weighted random patterns; Benchmark testing; Chip scale packaging; Data systems; Fault detection; Linear feedback shift registers; Logic design; Logic devices; Logic testing; Random number generation; Test pattern generators;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207809
