AFM study of atomic-flat terraces on ZnWO4 (010) cleaved surface

Author

Kozhukhov, Anton S. ; Atuchin, Victor V. ; Galashov, Evgeny N. ; Shlegel, Vladimir N.

Author_Institution

Phys. Dept., Novosibirsk State Univ., Novosibirsk, Russia

fYear

2011

fDate

June 30 2011-July 4 2011

Firstpage

19

Lastpage

22

Abstract

Atomic force microscopy (AFM) is a useful instrument to explore the top-surface properties. The nano-morphology of ZnWO₄ (010) cleaved surface has been evaluated in the present study. Optical-quality ZnWO₄ crystal has been grown by the Low Thermal Gradient Czochralski technique. An atomically smooth surface can be obtained by mechanical cleaving under ambient atmospheric conditions due to high cleavage of ZnWO₄ crystal parallel the (010). Atomic steps with height of 0.57 nm were observed by AFM measurements. The steps contain mesodefect peaks with height of ~1 nm located uniformly on the cleaved surface.

Keywords

atomic force microscopy; crystal growth from melt; crystal morphology; zinc compounds; AFM; ZnWO₄; ZnWO₄ (010) cleaved surface; atomic force microscopy; atomic-flat terraces; low thermal gradient Czochralski method; mechanical cleaving; nanomorphology; optical-quality crystal; top-surface properties; Annealing; Atomic measurements; Chemistry; Crystals; Physics; Surface morphology; Surface topography; AFM; ZnWO4; cleavage; wolframite;

fLanguage

English

Publisher

ieee

Conference_Titel

Micro/Nanotechnologies and Electron Devices (EDM), 2011 International Conference and Seminar of Young Specialists on

Conference_Location

Erlagol, Altai

Print_ISBN

978-1-61284-793-1

Type

conf

DOI

10.1109/EDM.2011.6006883

Filename

6006883