DocumentCode :
3111026
Title :
Design for test and the cost of quality
Author :
Salzmann, Chris ; Funcell, Martin ; Taylor, Richard
Author_Institution :
Nat. Semicond. Corp., Santa Clara, CA, USA
fYear :
1988
fDate :
12-14 Sep 1988
Firstpage :
302
Lastpage :
307
Abstract :
A generalized methodology is presented which can be used to select a cost effective design-for-test technique for use in the design process. The intent is to factor in both increased research and development costs as well as increased production costs. The authors also correlate the expected levels of test coverage. Thus, for a particular design, it is possible to predict the increase in cost of research and development, and increased production costs, and correlate this with test coverage. The tangible factors in the cost of quality can be determined
Keywords :
economics; electronic equipment testing; production testing; quality control; cost effective design-for-test; production costs; quality; Costs; Design for testability; Equations; Logic design; Logic gates; Logic testing; Production; Resource management; Semiconductor device reliability; Semiconductor device testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-8186-0870-6
Type :
conf
DOI :
10.1109/TEST.1988.207815
Filename :
207815
Link To Document :
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