• DocumentCode
    3111037
  • Title

    100 mm GaN-on-SiC RF MMIC technology

  • Author

    Palmour, John W. ; Hallin, C. ; Burk, A. ; Radulescu, Fabian ; Namishia, D. ; Hagleitner, H. ; Duc, Janusz ; Pribble, B. ; Sheppard, S.T. ; Barner, J.B. ; Milligan, J.

  • Author_Institution
    Cree, Inc., Durham, NC, USA
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    1226
  • Lastpage
    1229
  • Abstract
    100 mm diameter 4H-SiC High Purity Semi-insulating substrates are now being manufactured in high volume. GaN HEMT layers grown on 100 mm SiC substrates have shown excellent sheet resistivity and AlGaN thickness uniformities (σ/mean) of 1.3 and 1.1%, respectively. The fabrication process for MMIC manufacture was adapted to the larger diameter substrates without requiring any change to the process design kits for the foundry. MIM capacitor processes were optimized, and resistor process, wafer thinning and slot via etching were all adapted to the larger platform. These 100 mm wafers are now being used in high volume production of both high power discrete GaN devices, as well as MMICs. Commercially available MMICs have been released to production using this 100 mm platform. A wide band 25 Watt power amplifier is discussed, along with a 3 watt driver capable of DC-4 GHz operation.
  • Keywords
    HEMT integrated circuits; III-V semiconductors; MIM devices; MMIC; aluminium compounds; capacitors; etching; foundries; gallium compounds; silicon compounds; wide band gap semiconductors; AlGaN; GaN; HEMT layer; MIM capacitor processes; RF MMIC technology; SiC; frequency 4 GHz; high purity semi-insulating substrates; power 25 W; power 3 W; resistor process; sheet resistivity; size 100 mm; slot via etching; wafer thinning; Aluminum gallium nitride; Conductivity; Fabrication; Gallium nitride; HEMTs; MMICs; Manufacturing; Production; Radio frequency; Silicon carbide; GaN; HEMTs; MMICs; SiC; power amplifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5515973
  • Filename
    5515973